The development of innovative materials requires the implementation of specific techniques for their characterization. The X-Ray fluorescence analysis under grazing incidence (GIXRF ) technique allows identification and quantitation of materails and impurities, including in-depth characterization of interfaces, and finally, correlation of material properties with their structure. This technique will be implemented on a dedicated goniometer installed on the Metrology beamline of the SOLEIL synchrotron facility. Metrological characterization work will be required before commissioning the goniometer and using it for reliable quantitative measurements. The development of reference-free analysis will require the development of specific tools to perform spectral analysis and quantification of materials. The student will develop and validate measurement protocols for quantitative analysis under grazing incidence and will have to produce quantitative results on selected samples. This work , linked with two European projects will be undertaken in conjunction with the German laboratory PTB (Physikalisch Technische Bundestanstalt).

This position is open until it is filled.

Département: DM2I (LIST)
Laboratory: Laboratoire de Métrologie de l’Activité
Start Date: 01-12-2014
ECA Code: PsD-DRT-14-0117
Contact: yves.menesguen<στο>cea.fr